Hot Carrier Effect in Low Temperature Poly-Silicon Thin Film Transistors

Y. Uraoka; T. Hatayama; T. Fuyuki; T. Kawamura; Y. Tsuchihashi

doi:https://doi.org/10.7567/SSDM.2000.B-8-3

2000 International Conference on Solid State Devices and Materials

2000年8月29日〜 2000年8月31日
Sendai International Center, Sendai, Japan

[B-8-3] Hot Carrier Effect in Low Temperature Poly-Silicon Thin Film Transistors

Y. Uraoka、T. Hatayama、T. Fuyuki、T. Kawamura、Y. Tsuchihashi (1.Materials Science, Nara Institute of Science and Technology、2.LCD Division, Matsushita Electric Industrial Co., Ltd.)

https://doi.org/10.7567/SSDM.2000.B-8-3

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