The Japan Society of Applied Physics

[D-1-5] An Evidence for Ballistic Transport in Nanocrystalline Porous Silicon Layer by Time-of-Flight Measurements

Akira Kojima、Nobuyoshi Koshida (1.Department of Electrical and Electronic Engineering, Faculty of Technology, Tokyo University of Agriculture and Technology)

https://doi.org/10.7567/SSDM.2000.D-1-5