Kelvin Probe Force Microscopy for Surface Potential Measurements on InAs Nanostructures Grown on (110) GaAs Vicinal Substrates

Shiano Ono; Misaichi Takeuchi; Takuji Takahashi

doi:https://doi.org/10.7567/SSDM.2000.D-5-5

[D-5-5] Kelvin Probe Force Microscopy for Surface Potential Measurements on InAs Nanostructures Grown on (110) GaAs Vicinal Substrates

Shiano Ono、Misaichi Takeuchi、Takuji Takahashi (1.Institute of Industrial Science, University of Tokyo、2.Semiconductors Laboratory, The Institute of Physical and Chemical Research (RIKEN))

https://doi.org/10.7567/SSDM.2000.D-5-5

2000 International Conference on Solid State Devices and Materials

[D-5-5] Kelvin Probe Force Microscopy for Surface Potential Measurements on InAs Nanostructures Grown on (110) GaAs Vicinal Substrates