[B-4-5] Current-Voltage Charactreistics of Gate Oxides after Hard Breakdown

Twan Bearda, Pierre H. Woerlee, Hans Wallinga, Paul W. Mertens, Marc M. Heyns (1.Interuniversitary Micro-Electronics Center, 2.University of Twente)

https://doi.org/10.7567/SSDM.2001.B-4-5