[C-1-1] RF Power Performance of AlGaN/GaN HJFETs
N. Hayama, Y. Okamoto, K. Kasahara, T. Nakayama, Y. Ohno, H. Miyamoto, Y. Ando, M. Kazuhara, NEC, Japan
(1.Photonic and Wireless Devices Research Laboratories, NEC Corporation, 2.The University of Tokushima)
https://doi.org/10.7567/SSDM.2001.C-1-1