Impact of Hot Carrier Stress on Low-Frequency Noise Characteristics in Floating-Body SOI MOSFETs

Toshiaki Tsuchiya; Toshiyuki Yoshida; Yasuhiro Sato

doi:https://doi.org/10.7567/SSDM.2001.C-6-4

[C-6-4] Impact of Hot Carrier Stress on Low-Frequency Noise Characteristics in Floating-Body SOI MOSFETs

Toshiaki Tsuchiya, Toshiyuki Yoshida, Yasuhiro Sato (1.Interdisciplinary Faculty of Science and Engineering, Shimane University, 2.NTT Telecommunications Energy Laboratories)

https://doi.org/10.7567/SSDM.2001.C-6-4

2001 International Conference on Solid State Devices and Materials

[C-6-4] Impact of Hot Carrier Stress on Low-Frequency Noise Characteristics in Floating-Body SOI MOSFETs