[C-6-4] Impact of Hot Carrier Stress on Low-Frequency Noise Characteristics in Floating-Body SOI MOSFETs
Toshiaki Tsuchiya、Toshiyuki Yoshida、Yasuhiro Sato
(1.Interdisciplinary Faculty of Science and Engineering, Shimane University、2.NTT Telecommunications Energy Laboratories)
https://doi.org/10.7567/SSDM.2001.C-6-4