[C-9-1] Trap Density Dependent Inelastic Tunneling in Stress-Induced Leakage Current
Shigeyasu Uno, Kazuaki Deguchi, Yoshinari Kamakura, Kenji Taniguchi
(1.Department of Electronics and Information Systems, Osaka University)
https://doi.org/10.7567/SSDM.2001.C-9-1