Time Dependent Anomalous Charge Loss Modeling in Flash Memories and an Accelerated Testing Procedure

Franz Schuler; Georg Tempel; Hanno Melzner; Paul Hendrickx; Dirk Wellekens; Martino Lorenzini; Jan Van Houdt

doi:https://doi.org/10.7567/SSDM.2001.C-9-4

[C-9-4] Time Dependent Anomalous Charge Loss Modeling in Flash Memories and an Accelerated Testing Procedure

Franz Schuler, Georg Tempel, Hanno Melzner, Paul Hendrickx, Dirk Wellekens, Martino Lorenzini, Jan Van Houdt (1.Infineon Technologies AG, 2.IMEC vzw., 3.Kapeldreef 75, 4.Otto-Hahn-Ring)

https://doi.org/10.7567/SSDM.2001.C-9-4

2001 International Conference on Solid State Devices and Materials

[C-9-4] Time Dependent Anomalous Charge Loss Modeling in Flash Memories and an Accelerated Testing Procedure