[D-8-2] Nanometer-Scale Characteriazation by Scanning Tuneling Microscopy

G. Meyer, J. Repp, F. Moresco, S. W. Hla, S. Folsch, K. H. Rieder, H. Tang, A. Gourdon, C. Joachim (1.Paul-Drude-Institut fur Festkorperelektronik, 2.Institut fur Experimentalphysik, Freie Universitat Berlin, 3.CEMES-CNRS)

https://doi.org/10.7567/SSDM.2001.D-8-2