[D-8-2] Nanometer-Scale Characteriazation by Scanning Tuneling Microscopy

G. Meyer、J. Repp、F. Moresco、S. W. Hla、S. Folsch、K. H. Rieder、H. Tang、A. Gourdon、C. Joachim (1.Paul-Drude-Institut fur Festkorperelektronik、2.Institut fur Experimentalphysik, Freie Universitat Berlin、3.CEMES-CNRS)

https://doi.org/10.7567/SSDM.2001.D-8-2