[E-1-6] Interface Properties between Ni and p-GaN Studied by Photoemission Spectroscopy

Y. Hagio、T. Maruyama、Y. Nanishi、K. Akimoto、T. Miyajima、S. Kijima (1.Inst. of Applied Physics, Univ. of Tsukuba、2.Dept. of Photonics, Ritsumeikan Univ.、3.Sony Corporation Research Center)

https://doi.org/10.7567/SSDM.2001.E-1-6