Excess Noise Characteristics of a-Si:H p-i-n Photodiode Films

Masahiro Akiyama; Masaki Hanada; Hidekuni Takao; Kazuaki Sawada; Makoto Ishida

doi:https://doi.org/10.7567/SSDM.2001.E-7-5

2001 International Conference on Solid State Devices and Materials

Sep 26, 2001 - Sep 28, 2001
Diamond Hotel, Tokyo, Japan

[E-7-5] Excess Noise Characteristics of a-Si:H p-i-n Photodiode Films

Masahiro Akiyama, Masaki Hanada, Hidekuni Takao, Kazuaki Sawada, Makoto Ishida (1.Department of Electrical and Electronic Engineeirng, Toyohashi University of Technology)

https://doi.org/10.7567/SSDM.2001.E-7-5

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