[F-5-6] Investigation on Switching Kinetics of Interface Traps Through MOSFETs with Ultra Narrow Channels

Y. Shi, B. Shen, H. M. Bu, X. L. Yuan, S. L. Gu, P. Han, R. Zhang, Y. D. Zheng (1.Department of Physics & National Laboratory of Solid State Microstructures, Nanjing University)

https://doi.org/10.7567/SSDM.2001.F-5-6