[F-5-6] Investigation on Switching Kinetics of Interface Traps Through MOSFETs with Ultra Narrow Channels

Y. Shi、B. Shen、H. M. Bu、X. L. Yuan、S. L. Gu、P. Han、R. Zhang、Y. D. Zheng (1.Department of Physics & National Laboratory of Solid State Microstructures, Nanjing University)

https://doi.org/10.7567/SSDM.2001.F-5-6