AFM and KFM Measurements of Semiconductor Surface Using Carbon Nanotube Tip Fabricated by Electrophoresis

T. Maeda; Norihito Ozeki; Sigeru Kishimoto; Toshiki Sugai; Takashi Mizutani; Hisanori Shinohara

doi:https://doi.org/10.7567/SSDM.2001.P-1-22

[P-1-22] AFM and KFM Measurements of Semiconductor Surface Using Carbon Nanotube Tip Fabricated by Electrophoresis

T. Maeda, Norihito Ozeki, Sigeru Kishimoto, Toshiki Sugai, Takashi Mizutani, Hisanori Shinohara (1.Department of Quantum Engineering, Graduate School of Engineering, Nagoya University, 2.Department of Chemistry, Graduate School of Science, Nagoya University)

https://doi.org/10.7567/SSDM.2001.P-1-22

2001 International Conference on Solid State Devices and Materials

[P-1-22] AFM and KFM Measurements of Semiconductor Surface Using Carbon Nanotube Tip Fabricated by Electrophoresis