[A-3-3] Reduction of Gate-Induced Drain Leakage (GIDL) Current in Single-Gate Ultra-Thin Body and Double-Gate FinFET Devices

Yang-Kyu Choi、Daewon Ha、Tsu-Jae King、Jeffrey Bokor (1.Department of Electrical Engineering and Computer Sciences University of California)

https://doi.org/10.7567/SSDM.2002.A-3-3