Device Scaling and Prospect of GaN FET

Yasuo Ohno; Jin-Ping Ao

doi:https://doi.org/10.7567/SSDM.2002.E-2-2

2002 International Conference on Solid State Devices and Materials

2002年9月17日〜 2002年9月19日
Nagoya Congress Center, Nagoya, Japan

[E-2-2] Device Scaling and Prospect of GaN FET

Yasuo Ohno、Jin-Ping Ao (1.Department of Electrical and Electronic Engineering, The University of Tokushima、2.Satellite Venture Business Laboratory, The University of Tokushima)

https://doi.org/10.7567/SSDM.2002.E-2-2

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