[F-2-2] Impedance analysis of a radio-frequency single electron transistor

H. D. Cheong、T. Fujisawa、T. Hayashi、Y. H. Jeong、Y. Hirayama (1.NTT Basic Research Laboratories, NTT Corporation、2.Pohang University of Science and Technology, Dept. of Electronic and Electrical Eng.、3.CREST)

https://doi.org/10.7567/SSDM.2002.F-2-2