[F-2-2] Impedance analysis of a radio-frequency single electron transistor

H. D. Cheong, T. Fujisawa, T. Hayashi, Y. H. Jeong, Y. Hirayama (1.NTT Basic Research Laboratories, NTT Corporation, 2.Pohang University of Science and Technology, Dept. of Electronic and Electrical Eng., 3.CREST)

https://doi.org/10.7567/SSDM.2002.F-2-2