[F-2-3] Tunneling Mode Dependence of Current-Voltage Characteristics in Si/SiO2 Resonant Tunneling Diodes

Masanori Iwasaki, Yasuhiko Ishikawa, Hiroya Ikeda, Michiharu Tabe (1.Research Institute of Electronics, Shizuoka University)

https://doi.org/10.7567/SSDM.2002.F-2-3