Zinc Beam Flux Dependence of MBE-ZnO Growth

Hiroyuki Kato; Michihiro Sano; Kazuhiro Miyamoto; Takafumi Tao

doi:https://doi.org/10.7567/SSDM.2002.G-6-3

2002 International Conference on Solid State Devices and Materials

2002年9月17日〜 2002年9月19日
Nagoya Congress Center, Nagoya, Japan

[G-6-3] Zinc Beam Flux Dependence of MBE-ZnO Growth

Hiroyuki Kato、Michihiro Sano、Kazuhiro Miyamoto、Takafumi Tao (1.Stanley Electric Co., Ltd., Research & Development Center、2.Tohoku University, Institute for Materials Research)

https://doi.org/10.7567/SSDM.2002.G-6-3

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