[G-7-2] Device Temperature Measurement of High-Biased AlGaN/GaN High-Electron-Mobility Transistors

Naoteru Shigekawa、Kiyomitsu Onodera、Kenji Shiojima (1.NTT Photonics Laboratories)

https://doi.org/10.7567/SSDM.2002.G-7-2