A Method of Predicting Retention Lifetime of EEPROM by Voltage Acceleration

2002 International Conference on Solid State Devices and Materials

Sep 17, 2002 - Sep 19, 2002
Nagoya Congress Center, Nagoya, Japan

Yukihiko Watanabe, Yasuiti Mitsushima, Mitsutaka Katada, Hiroyasu Ito (1.Toyota Central R&D Labs., Inc., 2.Device R & D DENSO CORPORATION)