[LP10-1] A Method of Predicting Retention Lifetime of EEPROM by Voltage Acceleration

Yukihiko Watanabe、Yasuiti Mitsushima、Mitsutaka Katada、Hiroyasu Ito (1.Toyota Central R&D Labs., Inc.、2.Device R & D DENSO CORPORATION)

https://doi.org/10.7567/SSDM.2002.LP10-1