[P6-6] Experimental Characterization of Photonic Crystal Delay Lines Based on Coupled Defects

Kyozo Kanamoto, Sheng Lan, Satoshi Nishikawa, Naoki Ikeda, Yoshimasa Sugimoto, Kiyoshi Asakawa, Osamu Wada, Hiroshi Ishikawa (1.The Femtsecond Technology Research Association (FESTA), 2.Advanced Technology R&D Center, Mitsubishi Electric Corp., 3.Department of Electrical and Engineering, Kobe Univ.)

https://doi.org/10.7567/SSDM.2002.P6-6