[P6-6] Experimental Characterization of Photonic Crystal Delay Lines Based on Coupled Defects

Kyozo Kanamoto、Sheng Lan、Satoshi Nishikawa、Naoki Ikeda、Yoshimasa Sugimoto、Kiyoshi Asakawa、Osamu Wada、Hiroshi Ishikawa (1.The Femtsecond Technology Research Association (FESTA)、2.Advanced Technology R&D Center, Mitsubishi Electric Corp.、3.Department of Electrical and Engineering, Kobe Univ.)

https://doi.org/10.7567/SSDM.2002.P6-6