The Japan Society of Applied Physics

[A-3-4] A Novel Approach for Determination of Tunneling Mass, meff - Conduction Band Offset Energy, EB, Products for Advanced Gate Dielectrics

C.L. Hinkle, C. Fulton, R.J. Nemanich, G. Lucovsky (1.North Carolina State University, Department of Physics)

https://doi.org/10.7567/SSDM.2003.A-3-4