Measurement of Lateral Carrier Mobility in Organic Thin Films Using Time of Flight Method

Masatoshi Kitamura; Tadahiro Imada; Satoshi Kako; Yasuhiko Arakawa

doi:https://doi.org/10.7567/SSDM.2003.C-7-4

2003 International Conference on Solid State Devices and Materials

Sep 16, 2003 - Sep 18, 2003
Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan

[C-7-4] Measurement of Lateral Carrier Mobility in Organic Thin Films Using Time of Flight Method

Masatoshi Kitamura, Tadahiro Imada, Satoshi Kako, Yasuhiko Arakawa (1.Research Center of Advanced Science and Technologies, University of Tokyo, 2.Institute of Industrial Science, University of Tokyo)

https://doi.org/10.7567/SSDM.2003.C-7-4

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