New insights into dynamic negative bias temperature instability of pMOSFETs

Shyue Seng Tan; Tu Pei Chen; Chew Hoe Ang; W. Y. Teo; Lap Chan

doi:https://doi.org/10.7567/SSDM.2003.D-1-2

2003 International Conference on Solid State Devices and Materials

2003年9月16日〜 2003年9月18日
Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan

[D-1-2] New insights into dynamic negative bias temperature instability of pMOSFETs

Shyue Seng Tan、Tu Pei Chen、Chew Hoe Ang、W. Y. Teo、Lap Chan (1.School of Electrical & Electronic Engineering, Nanyang Technological University、2.Technology Development Department, Chartered Semiconductor Manufacturing Limited)

https://doi.org/10.7567/SSDM.2003.D-1-2

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