[D-3-3] Impact Ionization in Uniaxially Strained-Si MOSFET Naoya Watanabe、Yasuhiro Maeda、Mika Nishisaka、Tanemasa Asano (1.Center for Microelectronic Systems, Kyushu Institute of Technology) https://doi.org/10.7567/SSDM.2003.D-3-3
