Electronic Charged States of Single Si Quantum Dots with Ge Core as Detected by AFM/Kelvin Probe Technique

Yudi Darma; Kohei Takeuchi; Seiichi Miyazaki

doi:https://doi.org/10.7567/SSDM.2003.E-3-3

2003 International Conference on Solid State Devices and Materials

2003年9月16日〜 2003年9月18日
Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan

[E-3-3] Electronic Charged States of Single Si Quantum Dots with Ge Core as Detected by AFM/Kelvin Probe Technique

Yudi Darma、Kohei Takeuchi、Seiichi Miyazaki (1.Department of Electrical Engineering, Graduate School of Advanced Sciences and Matter, Hiroshima University)

https://doi.org/10.7567/SSDM.2003.E-3-3

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