[E-6-2] Photon-induced effect on single-charge-tunneling in a Si multidot Schottky FET

Ratno Nuryadi, Hiroya Ikeda, Yasuhiko Ishikawa, Michiharu Tabe (1.Research Institute of Electronics, Shizuoka University)

https://doi.org/10.7567/SSDM.2003.E-6-2