Control of Electrical Property in Multi-Wall Carbon Nanotube using Electrical Breakdown

Nobuyuki Aoki; Koichiro Miyamoto; Nobuko Oguri; Takahiko Sasaki; Koji Ishibashi; Yuichi Ochiai

doi:https://doi.org/10.7567/SSDM.2003.E-8-4

2003 International Conference on Solid State Devices and Materials

Sep 16, 2003 - Sep 18, 2003
Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan

[E-8-4] Control of Electrical Property in Multi-Wall Carbon Nanotube using Electrical Breakdown

Nobuyuki Aoki, Koichiro Miyamoto, Nobuko Oguri, Takahiko Sasaki, Koji Ishibashi, Yuichi Ochiai (1.Department of Materials Technology & Center for Frontier Electronics and Photonics, Chiba University, 2.Advanced Device Laboratory, RIKEN)

https://doi.org/10.7567/SSDM.2003.E-8-4

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