Control of Electrical Property in Multi-Wall Carbon Nanotube using Electrical Breakdown

Nobuyuki Aoki; Koichiro Miyamoto; Nobuko Oguri; Takahiko Sasaki; Koji Ishibashi; Yuichi Ochiai

doi:https://doi.org/10.7567/SSDM.2003.E-8-4

2003 International Conference on Solid State Devices and Materials

2003年9月16日〜 2003年9月18日
Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan

[E-8-4] Control of Electrical Property in Multi-Wall Carbon Nanotube using Electrical Breakdown

Nobuyuki Aoki、Koichiro Miyamoto、Nobuko Oguri、Takahiko Sasaki、Koji Ishibashi、Yuichi Ochiai (1.Department of Materials Technology & Center for Frontier Electronics and Photonics, Chiba University、2.Advanced Device Laboratory, RIKEN)

https://doi.org/10.7567/SSDM.2003.E-8-4

▲