The Japan Society of Applied Physics

[F-1-3] Observation of Thermal Reliability of BCB Passivated InAlAs/InGaAs HEMTs

Myounghoon Yoon、Taeho Kim、Daehee Kim、Kyounghoon Yang (1.Division of Electrical Engineering, Dept. of EECS, Korea Advanced Institute of Science and Technology (KAIST))

https://doi.org/10.7567/SSDM.2003.F-1-3