Observation of Thermal Reliability of BCB Passivated InAlAs/InGaAs HEMTs

Myounghoon Yoon; Taeho Kim; Daehee Kim; Kyounghoon Yang

doi:https://doi.org/10.7567/SSDM.2003.F-1-3

2003 International Conference on Solid State Devices and Materials

2003年9月16日〜 2003年9月18日
Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan

[F-1-3] Observation of Thermal Reliability of BCB Passivated InAlAs/InGaAs HEMTs

Myounghoon Yoon、Taeho Kim、Daehee Kim、Kyounghoon Yang (1.Division of Electrical Engineering, Dept. of EECS, Korea Advanced Institute of Science and Technology (KAIST))

https://doi.org/10.7567/SSDM.2003.F-1-3

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