Ultra Small Random Number Generating Circuits With A Novel Noise Source Device

Shinichi Yasuda; Hideki Satake; Hanae Nozaki; Tetsufumi Tanamoto; Ryuji Ohba; Ken Uchida; Atsuhiro Kinoshita; Shinobu Fujita

doi:https://doi.org/10.7567/SSDM.2003.G-3-4

[G-3-4] Ultra Small Random Number Generating Circuits With A Novel Noise Source Device

Shinichi Yasuda, Hideki Satake, Hanae Nozaki, Tetsufumi Tanamoto, Ryuji Ohba, Ken Uchida, Atsuhiro Kinoshita, Shinobu Fujita (1.Advanced LSI Technology Laboratory, Corporate Research & Development Center, Toshiba Corporation, 2.Computer & Network Systems Laboratory, Corporate Research & Development Center, Toshiba Corporation)

https://doi.org/10.7567/SSDM.2003.G-3-4

2003 International Conference on Solid State Devices and Materials

[G-3-4] Ultra Small Random Number Generating Circuits With A Novel Noise Source Device