[P10-3] The Impact of Technology Parameters and Scaling on the Programming Performance and Drain Disturb in CHISEL Flash EEPROMs

Deleep R. Nair、Nihar R. Mohapatra、S. Mahapatra、S. Shukuri (1.Department of Electrical Engineering, Indian Institute of Technology、2.Semiconductor and Integrated Circuits Group, Hitachi Ltd.)

https://doi.org/10.7567/SSDM.2003.P10-3