Electrical Characterization Sub-micron MTJ Cells Using SPM

Seungbae Park; Jinhee Heo; Teawan Kim; Ilsub Chung

doi:https://doi.org/10.7567/SSDM.2003.P10-8

2003 International Conference on Solid State Devices and Materials

2003年9月16日〜 2003年9月18日
Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan

[P10-8] Electrical Characterization Sub-micron MTJ Cells Using SPM

Seungbae Park、Jinhee Heo、Teawan Kim、Ilsub Chung (1.School of Information and Communications Engineering, SungKyunKwan University、2.MD Laboratory, Samsung Advanced Institute of Technology)

https://doi.org/10.7567/SSDM.2003.P10-8

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