Modeling of Pocket Implant Effect on Drain Current Flicker Noise in High Performance Analog CMOS Devices

Jun-Wei Wu; J. C. Guo; Kai-Lin Chiu; Chih-Chang Cheng; W. Y. Lien; G. W. Huang; Tahui Wang

doi:https://doi.org/10.7567/SSDM.2003.P2-3

2003 International Conference on Solid State Devices and Materials

2003年9月16日〜 2003年9月18日
Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan

[P2-3] Modeling of Pocket Implant Effect on Drain Current Flicker Noise in High Performance Analog CMOS Devices

Jun-Wei Wu、J. C. Guo、Kai-Lin Chiu、Chih-Chang Cheng、W. Y. Lien、G. W. Huang、Tahui Wang (1.Dept. of Electronics Engineering, National Chiao-Tung University、2.Taiwan Semiconductor Manufacturing Company、3.National Nano Device Laboratories)

https://doi.org/10.7567/SSDM.2003.P2-3

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