[P2-3] Modeling of Pocket Implant Effect on Drain Current Flicker Noise in High Performance Analog CMOS Devices

Jun-Wei Wu, J. C. Guo, Kai-Lin Chiu, Chih-Chang Cheng, W. Y. Lien, G. W. Huang, Tahui Wang (1.Dept. of Electronics Engineering, National Chiao-Tung University, 2.Taiwan Semiconductor Manufacturing Company, 3.National Nano Device Laboratories)

https://doi.org/10.7567/SSDM.2003.P2-3