Near-Field Raman Microscopy of Si and Si-Based Structures Using AFM-Tip-Induced Breaking of Selection Rules

Vladimir Poborchii; Tetsuya Tada; Toshihiko Kanayama

doi:https://doi.org/10.7567/SSDM.2003.P4-19L

2003 International Conference on Solid State Devices and Materials

Sep 16, 2003 - Sep 18, 2003
Keio Plaza Inter-Continental Tokyo (Keio Plaza Hotel), Tokyo, Japan

[P4-19L] Near-Field Raman Microscopy of Si and Si-Based Structures Using AFM-Tip-Induced Breaking of Selection Rules

Vladimir Poborchii, Tetsuya Tada, Toshihiko Kanayama (1.MIRAI, Advanced Semiconductor Research Center, National Institute of Advanced Industrial Science and Technology)

https://doi.org/10.7567/SSDM.2003.P4-19L

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