[C-6-2] Temperature Dependence of Off-Current in Bulk and FD SOI MOSFETs

Kousuke Miyaji、Masumi Saitoh、Toshiharu Nagumo、Toshiro Hiramoto (1.Institute of Industrial Science, University of Tokyo)

https://doi.org/10.7567/SSDM.2004.C-6-2