[F-10-3] Bending and recovery tests of organic field-effect transistors

Tsuyoshi Sekitani, Shingo Iba, Yusaku Kato, Hiroshi Shinaoka, Takao Someya (1.Quantum-Phase Electronics Center, The University of Tokyo)

https://doi.org/10.7567/SSDM.2004.F-10-3