Watchdog Circuit for Product Degradation Monitor using Subthreshold MOS Current

Tetsuya HIROSE; Ryuji YOSHIMURA; Toru IDO; Toshimasa MATSUOKA; Kenji TANIGUCHI

doi:https://doi.org/10.7567/SSDM.2004.I-2-4

2004 International Conference on Solid State Devices and Materials

2004年9月14日〜 2004年9月17日
Tower Hall Funabori, Tokyo, Japan

[I-2-4] Watchdog Circuit for Product Degradation Monitor using Subthreshold MOS Current

Tetsuya HIROSE、Ryuji YOSHIMURA、Toru IDO、Toshimasa MATSUOKA、Kenji TANIGUCHI (1.Department of Electronics and Information Systems, Graduate School of Eng., Osaka University)

https://doi.org/10.7567/SSDM.2004.I-2-4

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