Watchdog Circuit for Product Degradation Monitor using Subthreshold MOS Current

Tetsuya HIROSE; Ryuji YOSHIMURA; Toru IDO; Toshimasa MATSUOKA; Kenji TANIGUCHI

doi:https://doi.org/10.7567/SSDM.2004.I-2-4

2004 International Conference on Solid State Devices and Materials

Sep 14, 2004 - Sep 17, 2004
Tower Hall Funabori, Tokyo, Japan

[I-2-4] Watchdog Circuit for Product Degradation Monitor using Subthreshold MOS Current

Tetsuya HIROSE, Ryuji YOSHIMURA, Toru IDO, Toshimasa MATSUOKA, Kenji TANIGUCHI (1.Department of Electronics and Information Systems, Graduate School of Eng., Osaka University)

https://doi.org/10.7567/SSDM.2004.I-2-4

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