Shot Noise Measurement in p-i-n Diode and Its Analysis

K. Hara; O. Matsushima; G. Suzuki; D. Navarro; K. Konno; Y. Isobe; M. Miura-Mattausch

doi:https://doi.org/10.7567/SSDM.2004.P2-18

2004 International Conference on Solid State Devices and Materials

2004年9月14日〜 2004年9月17日
Tower Hall Funabori, Tokyo, Japan

[P2-18] Shot Noise Measurement in p-i-n Diode and Its Analysis

K. Hara、O. Matsushima、G. Suzuki、D. Navarro、K. Konno、Y. Isobe、M. Miura-Mattausch (1.Graduate School of Advanced Sciences of Matter, Hiroshima University)

https://doi.org/10.7567/SSDM.2004.P2-18

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