[P2-2] The Impact of Pad Test-Fixture for De-embedding on Radio-Frequency MOSFETs

Wen-Kuan Yeh、Chieh-Ming Lai、Chia-Che Hu、Chao-Ching Ku、Shuo-Mao Chen、Shing-Tai Pan、Yean-Kuan Fang、J. P. Chao (1.Department of Electrical Engineering, National University of Kaohsiung, Taiwan.、2.Department of Computer Science Information Engineering, Shu-Te University, Taiwan.、3.Institute of Microelectronics, National Cheng Kung University, Taiwan.、4.Taiwan Semiconductor Manufacturing Company)

https://doi.org/10.7567/SSDM.2004.P2-2