[P2-2] The Impact of Pad Test-Fixture for De-embedding on Radio-Frequency MOSFETs

Wen-Kuan Yeh, Chieh-Ming Lai, Chia-Che Hu, Chao-Ching Ku, Shuo-Mao Chen, Shing-Tai Pan, Yean-Kuan Fang, J. P. Chao (1.Department of Electrical Engineering, National University of Kaohsiung, Taiwan., 2.Department of Computer Science Information Engineering, Shu-Te University, Taiwan., 3.Institute of Microelectronics, National Cheng Kung University, Taiwan., 4.Taiwan Semiconductor Manufacturing Company)

https://doi.org/10.7567/SSDM.2004.P2-2